Nanotechnology is a key driving force bridging fundamental science and industrial innovation. Over the past few decades, atomic force microscopy (AFM) has established itself as an essential tool for exploring and characterizing the nanoscale world.

Precise visualization and measurement of nanostructures, from fundamental and advanced materials to biological systems, provide a critical foundation for scientific discovery and technological innovation.

In particular, as advanced semiconductor devices evolve toward increasingly complex three-dimensional architectures, nanoscale surface metrology is becoming increasingly important for process development, device characterization, and yield improvement.

Multiscale Instruments introduces Quartz Resonator-based Self-Sensing Technology, a fundamentally different approach to nanoscale measurement that eliminates the need for complex external optical detection systems.

By directly detecting nanomechanical motion through the piezoelectric response of a quartz resonator, this architecture combines high mechanical rigidity with exceptional sensing stability. Precise control of the tip–sample interaction enables our Contactless™ measurement technology, allowing nanoscale surfaces to be

characterized with minimal   mechanical disturbance.

By minimizing the risk of damage to delicate samples while delivering highly stable and reproducible imaging, Contactless™ provides a powerful platform for next-generation nanoscale metrology.